IOMW7

Saturday, April 10
8:30-10:30 Session 1: Measurement Practice Chair: G.Engelhard
"Generally objective" measures of NAEP writing data J.Stenner
Attitudes toward educational experience D.Tatum, L.Webster
Youth leadership instrument W.Zhu, C.Ruhm
Evaluating portfolio assessment C.Myford
Home environment changes J.Monsaas, G.Engelhard
Change in functional performance L.Ludlow, S.Haley
Equivalence of a readiness test in two languages S.Lang

11:00-12:00 Session 2: Linear Programming and Test Equating Chair: B.Wright
0-1 linear programming for observed-score equating W.van der Linden
Interface for linear programming test construction E.Boekooi-Timminga
Item component equating R.Smith

1:00-2:30 Session 3: Computer Adaptive Tests Chair: W.van der Linden
Comparability of written and CAT tests G.Stone, M.Lunz
Design of adaptive tests and testlets M.Berger
Item selection strategies for math CAT R.Carlson, H.Suen
Parallel Raven items M.Sanchez, W.Koch

3:00-5:00 Session 4: Random Coefficient Multinomial Logits (RCML) Family
RCML Family M.Wilson
Applying RCML to item bias detection S.Moore
Multiple-choice and performance-based items W.Wang, M.Wilson
RCML investigation of linear logistic test models K.Draney, P.Pirolli, M.Wilson
Multilevel RCML model R.Adams, M.Wilson
Parameter recovery and two level RCML M.Wu, R.Adams

Sunday, April 11
8:30-10:30 Session 5: Measurement Theory Chair: D.Andrich
What makes people feel lonely LLTM analysis E.Roskam
Evaluation, assessment, measurement F.Shaw
Real-time cognitive process measurement R.Jannarone
Compensatory model for simultaneous cut scores H.Vos
Unfolding analysis J.Linacre
Construction of meaning B.Wright

11:00-12:00 Session 6: Analysis of Rating Scales Chair: M.Wilson
Dichotomization of graded responses D.Andrich
Threshold location B.Sheridan
Continuous data P.Pedler
Successive intervals B.Dodd, W.Koch

1:00-2:30 Session 7: Unidimensionality and Differential Item Functioning Chair: R.Smith
Multidimensional scaling for unidimensionality T-H.Chen, M.Davison
Logistic-regression for unidimensionality R.Anderson
Comparison of item bias detection methods S.Luppescu
W, B and Sato Caution Indices A.D'Costa
Sex bias in science achievement D.Young

3:00-5:00 Session 8: Measurement Application Chair: J.Monsaas
Measuring voting behavior F.Cerda
Effect of demographic variables R.Wilk
Student outcomes assessment R.Bruce
Primary reading tests T.K.Lim
Predicting academic performance C.Morrison
Selecting candidates for raters P.Alvarez
School leaving mathematics examination F.Shaw

Seventh International Objective Measurement Workshop

IOMW7 meets on April 10-11, 1993, Emory University (206 White Hall), just before AERA, April 12-16, in Atlanta. Measurement theorists and practitioners from the United States, Australia, the Netherlands, Singapore, South Africa, and Spain will attend.

Most convenient lodging is Emory Inn (404-712-6700, 800-933-6679) with shuttle bus to Emory University. IOMW7 group rate is $62. per room (single, double or triple - share and save!). The AERA conference hotels (Educational Researcher, Nov. 1992) are one-hour by public transport (MARTA) or 30 minutes by taxi from Emory. There are shuttle vans from Atlanta airport to Emory Inn or downtown.

Saturday Night Dinner: We plan to go to a nearby restaurant. If you want to join our party, let us know immediately.

Objective Measurement: Theory into Practice III. Editors, George Engelhard and Mark Wilson, ask that IOMW7 papers intended for publication in this volume be submitted before or at IOMW7.

Profs. George Engelhard, Jr & Judith A. Monsaas
IOMW7 Co-Chairs
Educational Studies, 201 Fishburne Building
Emory University, Atlanta GA 30322
Tel. (404) 727-0607, FAX (404) 727-2799

IOMW7 Program. … Rasch Measurement Transactions, 1993, 6:4 p. 248

Rasch Books and Publications
Invariant Measurement: Using Rasch Models in the Social, Behavioral, and Health Sciences, 2nd Edn. George Engelhard, Jr. & Jue Wang	Applying the Rasch Model (Winsteps, Facets) 4th Ed., Bond, Yan, Heene	Advances in Rasch Analyses in the Human Sciences (Winsteps, Facets) 1st Ed., Boone, Staver	Advances in Applications of Rasch Measurement in Science Education, X. Liu & W. J. Boone	Rasch Analysis in the Human Sciences (Winsteps) Boone, Staver, Yale
Introduction to Many-Facet Rasch Measurement (Facets), Thomas Eckes	Statistical Analyses for Language Testers (Facets), Rita Green	Invariant Measurement with Raters and Rating Scales: Rasch Models for Rater-Mediated Assessments (Facets), George Engelhard, Jr. & Stefanie Wind	Aplicação do Modelo de Rasch (Português), de Bond, Trevor G., Fox, Christine M	Appliquer le modèle de Rasch: Défis et pistes de solution (Winsteps) E. Dionne, S. Béland
Exploring Rating Scale Functioning for Survey Research (R, Facets), Stefanie Wind	Rasch Measurement: Applications, Khine	Winsteps Tutorials - free Facets Tutorials - free	Many-Facet Rasch Measurement (Facets) - free, J.M. Linacre	Fairness, Justice and Language Assessment (Winsteps, Facets), McNamara, Knoch, Fan
Other Rasch-Related Resources: Rasch Measurement YouTube Channel
Rasch Measurement Transactions & Rasch Measurement research papers - free	An Introduction to the Rasch Model with Examples in R (eRm, etc.), Debelak, Strobl, Zeigenfuse	Rasch Measurement Theory Analysis in R, Wind, Hua	Applying the Rasch Model in Social Sciences Using R, Lamprianou	El modelo métrico de Rasch: Fundamentación, implementación e interpretación de la medida en ciencias sociales (Spanish Edition), Manuel González-Montesinos M.
Rasch Models: Foundations, Recent Developments, and Applications, Fischer & Molenaar	Probabilistic Models for Some Intelligence and Attainment Tests, Georg Rasch	Rasch Models for Measurement, David Andrich	Constructing Measures, Mark Wilson	Best Test Design - free, Wright & Stone Rating Scale Analysis - free, Wright & Masters
Virtual Standard Setting: Setting Cut Scores, Charalambos Kollias	Diseño de Mejores Pruebas - free, Spanish Best Test Design	A Course in Rasch Measurement Theory, Andrich, Marais	Rasch Models in Health, Christensen, Kreiner, Mesba	Multivariate and Mixture Distribution Rasch Models, von Davier, Carstensen

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