Item Characteristic Curves: Model and Empirical.
Figure 3 in Rashid et. al (2008) WSEAS Transactions on Advance in Engineering Education, 8, 5, 591-602
|
Infit Mean-squares: Mean ± 2 S.D.
"There are no hard-and-fast rules for setting upper- and lower-control limits for the infit statistics (i.e., infit mean-square index). In general, as Pollitt and Hutchinson (1987) suggest, any individual infit mean-square value needs to be interpreted against the mean and standard deviation of the set of infit-mean square values for the facet concerned. Using these criteria, a value lower than the mean minus twice the standard deviation would indicate too little variation, lack of independence, or overfit. A value greater than the mean plus twice the standard deviation would indicate too much unpredictability, or misfit." (Park, 2004)
Comment: This advice accords with an investigation into "Do the data fit the model usefully". The mean-squares are geometric with a range of 0-1-∞, which suggests that the computation of mean and standard deviation should be done using loge(mean-squares). In general, overfit (low mean-square) is generally a much smaller threat to the validity of the measures than excessive unpredictability (high mean-square).
Park, T. (2004) An investigation of an ESL placement test using Many-Facet Rasch Measurement. Teachers College, Columbia University Working Papers in TESOL and Applied Linguistics, 4, 1
journals.tc-library.org/index.php/tesol/article/view/41/48
Pollitt, A., & Hutchinson, C. (1987). Calibrated graded assessment: Rasch partial credit analysis of performance in writing. Language Testing, 4, 72-92.
Various (2009) Notes and Quotes, Rasch Measurement Transactions, 2009, 23:1, 1197
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Invariant Measurement: Using Rasch Models in the Social, Behavioral, and Health Sciences, 2nd Edn. George Engelhard, Jr. & Jue Wang |
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Rasch Analysis in the Human Sciences (Winsteps) Boone, Staver, Yale |
Introduction to Many-Facet Rasch Measurement (Facets), Thomas Eckes |
Statistical Analyses for Language Testers (Facets), Rita Green |
Invariant Measurement with Raters and Rating Scales: Rasch Models for Rater-Mediated Assessments (Facets), George Engelhard, Jr. & Stefanie Wind |
Aplicação do Modelo de Rasch (Português), de Bond, Trevor G., Fox, Christine M |
Appliquer le modèle de Rasch: Défis et pistes de solution (Winsteps) E. Dionne, S. Béland |
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El modelo métrico de Rasch:
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Rasch Models: Foundations, Recent Developments, and Applications, Fischer & Molenaar |
Probabilistic Models for Some Intelligence and Attainment Tests, Georg Rasch |
Rasch Models for Measurement, David Andrich |
Constructing Measures, Mark Wilson |
Best Test Design - free, Wright & Stone Rating Scale Analysis - free, Wright & Masters |
Virtual Standard Setting: Setting Cut Scores, Charalambos Kollias |
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