Nov. 15, 2001: Just back from Penang, Malaysia as a paper presenter at the first International Conference on Measurement and Evaluation in Education organized by School of Educational Studies, Universitii Sains Malaysia.
Geoff Masters from ACER provided the opening plenary about setting Benchmarks and raised the role that objective measurement has in an educational evaluation system. From that moment on "Rasch" was an important byword for the whole conference. Given that Malaysia spend 23% of its GDP on education and outcome measurement systems are in the process on being implemented, the timing of this conference and the sharing of Rasch measurement ideas with the 200 participants might prove quite fortuitous.
Thanks to Wan Mohd Rani Abdullah who notified Rasch listers about this event. [To subscribe to the Rasch listserv, see www.rasch.org/rmt]
There were certainly some interesting papers presented and some important ideas canvassed. Two presentations which really caught my attention were a paper presented by Surintorn Suanthong and co-authored by Mary Lunz about "unanchoring" entitled "Factors Affecting Test Equating in Performance Examinations in Latent Trait Theory" and also a really scintillating performance by ex-MESA graduate Lee Ong Kim, from the National Institute of Education, Singapore, "Rasch one-step (concurrent) Equating for Measuring Reading Growth" - wow, what a presenter! [An example of his one-step (concurrent) work is in RMT 6:1.]
I encouraged both authors to submit to the Journal of Applied Measurement - this was real quality work.
The venue was marvelous, the setting idyllic, the food and shopping was great. Hospitality was wonderful. I felt so sorry for the hard-working organizers that a couple of key presenters didn't show - security concerns. (I felt much safer there than I do in New Orleans, Chicago or Mexico City.)
ICMEE 2003 will be in two years time - mark the date now.
You are already sorry that you didn't go this time. Trevor Bond
ICMEE Report. 2001. Bond T. 15:3 p. 833
ICMEE Report Bond T. Rasch Measurement Transactions, 2001, 15:3 p. 833
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