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Applying the Rasch Model. Fundamental Measurement in the Human Sciences. 2nd Edition.
Trevor G. Bond, James Cook University, & Christine M. Fox, University of Toledo, 2007, $45.00
New in the Second Edition
For many researchers the Rasch model provides a very practical solution to data
analysis in the social sciences. This volume contends that Rasch measurement is
"the model of choice" because it is the closest to realizing the sort of
objective fundamental measurement so long revered in the physical sciences.
Trevor Bond has worked with leading Rasch theoreticians for more than 15 years,
advising developmentalists and teachers on how to conduct and interpret Rasch
analyses of their own data. After each of his many research presentations,
Dr. Bond was asked to recommend a suitable text for those who wish to learn more
about Rasch analysis. Unfortunately, the books published to date require a
significant knowledge of statistics and are not easily accessible to many
practicing researchers. This lack of a suitable introductory text is the
driving force behind this book.
The goals of this authored volume are:
* to present an accessible overview of the basic properties and principles of Rasch analysis, that does not require a sophisticated statistical background;
* to demonstrate how Rasch analysis can be applied to a number of generic problems encountered by psychologists and educators; and
* to prepare readers for performing their own analyses and interpreting the results.
This book is ideal for researchers in the human sciences interested in learning how to implement the Rasch model with their own data.
Contents: Preface. Why Measurement Is Fundamental. Important Principles of Measurement Made Explicit. Basic Principles of the Rasch Model. Building a Set of Items for Measurement. Test Equating: Can Two Tests Measure the Same Ability? Measurement Using Likert Scales. The Partial Credit Rasch Model. Measuring Facets Beyond Ability and Difficulty. Revealing Stage-Based Development. The Rasch Model Applied Across the Human Sciences. Rasch Modeling Applied: Rating Scale Design. The Question of Model Fit. A Synthetic Overview. Appendices: Technical Aspects of the Rasch Model. Rasch Resources.
Official authors' website: Bond & Fox
Best Test Design by Benjamin D. Wright & Mark H. Stone, 1979, $40
Explains Rasch test item analysis and person measurement, demonstrating each step clearly, so that readers can apply these procedures to their own data. The detailed hand calculations show how simply and quickly these methods can be applied even without a computer. ISBN 0-941938-00-X. LC# 79-88489.
Rating Scale Analysis by Benjamin D. Wright & Geoff Masters, 1982, $40
Extends Rasch item analysis and person measurement to attitude questionnaires, performance ratings and any other ordered category data. Describes and uses estimation procedures for the computer and hand calculator. Applications to three attitude questionnaires and two performance tests are described. ISBN 0-941938-01-8. LC# 81-84992.
Probability in the Measure of Achievement by George S. Ingebo, 1997 $25
Shows the advantages of Rasch measurement for school district testing programs. Dr. George Ingebo contrasts the results of Rasch methods with conventional statistics for assessing student responses to basic skills testing. He presents testing issues in an accessible, down-to- earth manner.
Chapter I shows how the Rasch probability-based method produces measures that are more useful for students, parents, teachers, administrators and researchers than information provided by conventional population-based statistics.
Chapter 2 discusses the technology for designing and maintaining a large bank of curriculum test items that facilitate a reliable and precise measure of a student's ability growth between fall and spring and from year to year.
Chapter 3 presents a dozen research projects comparing conventional grade-level tests with Rasch calibrated levels-tests. Their findings support the use of the Rasch testing model. Chapter 4 offers a set of statistical comparisons of groups that can be useful to school district Administrators.
This book takes the uncertainty of student achievement testing out of the closet and looks it over on purpose - not with some comforting fiduciary limit, but with professional opinion backed up by wisdom and by a feeling of responsibility. 148 pp. Figs. ISBN 0-941938-09-3. LC# 97-076496.
Probabilistic Models for Some Intelligence and Attainment Tests by
Georg Rasch, with Foreword and Afterword by Benjamin D. Wright,
1992 (1980 Univ. of Chicago Press, 1960 Denmark) $30
"Rasch's book is an important contribution to the theory and practice of educational testing. It has spawned a substantial amount of significant research in statistics and educational testing." ISBN 0-941938-05- . LC# 80-16546.
Many-Facet Rasch Measurement by John Michael Linacre,
(1989), 2nd Edn. 1994 $40
Applies objective measurement to the ratings awarded by judges to persons on items of performance or any other many-facet situation. Derives the measurement model from Rasch's axioms and discusses estimation techniques. Extends objective measurement to multiple independent rank orderings. Examples of ratings and rankings are analyzed. ISBN 0-941938-02-6. LC# 94-76939.
Popular Measurement (PM): Online text of PM 1:1, 2:1, 3:1, 4:1
Purchase back issues of Vols. 1, 2, or 3 for $10.00 each plus $5.00 for shipping.
Rasch Measurement Transactions: Part 1 by John Michael Linacre (Editor), 1995 $35 (book). Contains the edited and updated contents of the periodical publication Rasch Measurement Transactions from 1987 (Vol. 1:1) to 1992 (Vol. 5:4). New material has been added. With indices and reference list. 208 pages. ISBN 0-941938-06-9. LC# 95-080148.
Rasch Measurement Transactions: Part 2 by John Michael Linacre (Editor), 1996 $35 (book). Contains the contents of the periodical publication Rasch Measurement Transactions from 1992 (Vol. 6:1) to 1995 (Vol. 8:4). With indices and reference list. 240 pages. ISBN 0-941938-07-7. LC# 95-080148.
Rasch Measurement Transactions from 1995 (Vol. 9:1) to current: only available as webpages.
Diseño de Mejores Pruebas [Spanish Translation of
Best Test Design] by Benjamin D. Wright & Mark H. Stone, translation
directed by Rafael Vidal. Mexico: CENEVAL, 1998. $40
Para el lector poco familiarizado con el análisis de ítemes es una fortuna que Benjamín Wright y Mark H. Stone hayan escrito un libro fácilmente comprensible y que lleva de la mano al lector para entender la filosofía y la técnica del análisis de Rasch con ejemplos sencillos que dejan ver toda la potencialidad de la técnica.
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|Applying the Rasch Model. 2nd Ed. (Bond & Fox)||$45.00 + $8.00 S&H in USA,|
$45.00 + $15.00 S&H elsewhere
|Best Test Design (Wright & Stone)||$40.00 + $8.00 S&H in USA,|
$40.00 + $15.00 S&H elsewhere
|Rating Scale Analysis (Wright & Masters)||$40.00 + $8.00 S&H in USA,|
$40.00 + $15.00 S&H elsewhere
|Probability in the Measure of Achievement (Ingebo)||$25.00 + $8.00 S&H in USA,|
$25.00 + $15.00 S&H elsewhere
|Other titles above||listed price + $8.00 S&H in USA,|
listed price + $15.00 S&H elsewhere
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